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Träfflista för sökning "WFRF:(Sun Jie 1977) ;pers:(Nielsen P.F.);spr:eng"

Search: WFRF:(Sun Jie 1977) > Nielsen P.F. > English

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1.
  • Buron, J.D., et al. (author)
  • Correlation between THz AC and micro-four-point-probe DC conductivity mapping of graphene sheets
  • 2012
  • In: Laser and Tera-Hertz Science and Technology, LTST 2012. - Washington, D.C. : OSA.
  • Conference paper (peer-reviewed)abstract
    • We present quantitative correlation mapping of the sheet conductance of large areas of graphene. Terahertz time-domain spectroscopy (THz-TDS) maps the nanoscale conductance averaged over the beam spot size whereas micro four-point probe (M4PP) maps the micro-scale conductance.
  •  
2.
  • Buron, J. D., et al. (author)
  • Graphene Conductance Uniformity Mapping
  • 2012
  • In: Nano Letters. - : American Chemical Society (ACS). - 1530-6992 .- 1530-6984. ; 12:10, s. 5074-5081
  • Journal article (peer-reviewed)abstract
    • We demonstrate a combination of micro four-point probe (M4PP) and non-contact terahertz time-domain spectroscopy (THz-TDS) measurements for centimeter scale quantitative mapping of the sheet conductance of large area chemical vapor deposited graphene films. Dual configuration M4PP measurements, demonstrated on graphene for the first time, provide valuable statistical insight into the influence of microscale defects on the conductance, while THz-TDS has potential as a fast, non-contact metrology method for mapping of the spatially averaged nanoscopic conductance on wafer-scale graphene with scan times of less than a minute for a 4-in. wafer. The combination of M4PP and THz-TDS conductance measurements, supported by micro Raman spectroscopy and optical imaging, reveals that the film is electrically continuous on the nanoscopic scale with microscopic defects likely originating from the transfer process, dominating the microscale conductance of the investigated graphene film.
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  • Result 1-2 of 2
Type of publication
journal article (1)
conference paper (1)
Type of content
peer-reviewed (2)
Author/Editor
Sun, Jie, 1977 (2)
Yurgens, Avgust, 195 ... (2)
Jepsen, P. U. (2)
Buron, J.D. (2)
Cooke, D.G. (2)
Hilke, M. (2)
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Whiteway, E. (2)
Hansen, O (1)
Bøggild, P. (1)
Pedersen, D.H. (1)
Petersen, D. H. (1)
Boggild, P. (1)
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University
Chalmers University of Technology (2)
Language
Research subject (UKÄ/SCB)
Natural sciences (1)
Engineering and Technology (1)
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